Impact of aluminum wire and ribbon bonding technologies on D2PAK package reliability during thermal cycling applications

نویسندگان

  • Sebastien Jacques
  • R. Leroy
  • Marc Lethiecq
چکیده

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 55  شماره 

صفحات  -

تاریخ انتشار 2015